Modelling light propagation in an antireflection structure stamped on the end of a halogenide ir fiber
B.O. Volodkin, D.L. Golovashkin, O.Y. Moiseev, Y.A. Orekhova, V.S. Pavelyev

Image Processing Systems Institute of the RAS,
Samara State Aerospace University

Full text of article: Russian language.

Abstract:
Diffraction of the mid-range IR radiation from a halogenide antireflection grating is modelled. In the computing experiment, an antireflection effect is discovered and characterized.

Key words:
antireflection structure, halogenide microrelief stamping, finite-difference solution of Maxwell’s equations.

Citation: Volodkin BO, Golovashkin DL, Moiseev YuA, Orekhova YuA, Pavelyev VS. Modelling light propagation in an antireflection structure stamped on the end of a halogenide IR fiber. Computer Optics 2008; 32(3): 191-40.

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