Calculation of diffraction of the linearly-polarized limited beam with uniform intensity on high-aperture binary micro-axicons in a near zone
S.N. Khonina, A.V. Ustinov,  S.G. Volotovsky, A.A. Kovalev

Image Processing Systems Institute, Russian Academy of Sciences,

Samara State Aerospace University

Full text of article: Russian language.

Abstract:
With application of the electromagnetic theory of diffraction the opportunity of superresolution achievement by means of binary high-aperture axicons is considered at linear polarization of radiation falling on an element. It is shown, that increase of the central light spot, which inevitably arises at linear polarization of the beam illuminating the high-aperture axicon, can be compensated by means of linear phase jump in the illuminating beam or due to use of bi-axicon instead of axially-symmetric axicon. Thus in immediate proximity from an optical element surface the light spot with size on 37 % less than the diffractive limit is formed.

Key words:
binary diffractive axicon, high-aperture optical element, linear polarization, the superresolution.

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