Subwavelength focusing using fresnel zone plate with focal length of 532nm
S.S. Stafeev, L. O'Faolain, M.I. Shanina, V.V. Kotlyar, V.A. Soifer
Full text of article: Russian language.
Abstract:
Using a near-field scanning optical microscope we measure a focal spot resulting from the illumination the phase zone plate with focal length 532 nm, radius 7,7 um and etch depth 510 nm by linearly polarized Gaussian beam with wavelength 532 nm. The diameter of focal spot equals to 0,44 of wavelength. The root-mean-square deviation of the focal spot intensity from the calculated value is 5%.
Key words:
scanning nearfield optical microscope, subwavelength focusing of laser light, phase zone plate.
References:
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