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Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysis
A.I. Antonov 1, G.I. Greisukh 1

1 Penza State University of Architecture and Construction,
Germana Titova Str. 28, Penza, 440028, Russia

 PDF, 1124 kB

DOI: 10.18287/2412-6179-CO-1575

Pages: 391-398.

Full text of article: Russian language.

Abstract:
Aiming to calculate the diffraction efficiency of diffractive optical elements with a two-layer microstructure and two internal sawtooth reliefs within the framework of the rigorous electromagnetic theory of diffraction, we propose an approach that involves calculating the efficiency of the element as a whole through the efficiency of each zone of the microstructure separately. This approach is a basis for a DE calculation method, which takes into account the normalized area of each zone of a two-layer microstructure, the temperature dependences of the depths of both reliefs and their refractive indices, as well as the local mutual displacement of the microstructure layers due to a difference in the thermal expansion coefficients of their materials. We present a mathematical apparatus of the proposed technique that minimizes the computational complexity and demonstrates its effectiveness by the example of calculating the diffraction efficiency of the diffractive element of an ultra-high-aperture refractive-diffraction athermal dual-band infrared lens. We show that due to variations in the operating temperature (from –40°C to + 60°C), the diffraction efficiency drops by no more than 7% over the entire operating spectral range (3.5 – 5.2 μm; 7.5 – 11.4 μm) with permissible angles of light incidence on the microstucture ranging from –14° to +14°.

Keywords:
diffractive optical element, two-layer microstructure with two internal sawtooth reliefs, diffraction efficiency, rigorous coupled-wave analysis, Fourier coefficients, temperature expansion, thermo-optical constants.

Citation:
Antonov AI, Greisukh GI. Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysis. Computer Optics 2025; 49(3): 391-398. DOI: 10.18287/2412-6179-CO-1575.

Acknowledgements:
The study was financially supported by a grant from the Russian Science Foundation under project no. 20-19-00081.

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