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Using a metasurface to detect fractional topological charges at different wavelengths
A.G. Nalimov 1,2, V.V. Kotlyar 1,2, Y.V. Khanenko 1,2, S.D. Poletaev 1,2

1 Image Processing Systems Institute, NRC “Kurchatov Institute”,
Molodogvardeyskaya Str. 151, Samara, 443001, Russia;
2 Samara National Research University,
443086, Moskovskoye Shosse 34, Samara, 443086, Russia

 PDF, 1454 kB

DOI: 10.18287/2412-6179-CO-1641

Pages: 893-898.

Full text of article: Russian language.

Abstract:
This paper demonstrates a possibility of detecting fractional topological charges (TC) using a metasurface in the near and far fields. The feasibility of detecting fractional TC at different wavelengths is studied. The light wavelength and TC can be estimated by shifting the light spot along different axes: when the wavelength of light changes, the light spot in the observation plane shifts along the X axis. When the fractional part of the TC changes, it shifts along the Y axis. The metasurface remains usable in the wavelength range from 0.56 to 0.7 μm.

Keywords:
topological charge, fractional optical vortex, multifocal metalens.

Citation:
Nalimov AG, Khanenko YV, Poletaev SD. Using a metasurface to detect fractional topological charges at different wavelengths. Computer Optics 2025; 49(6): 893-898. DOI: 10.18287/2412-6179-CO-1641.

Acknowledgements:
The work was partly funded by the Russian Science Foundation under grant #23-12-00236 (Section “Simulation”) and the RF Ministry of Science and Higher Education within a state contract of the Research Center "Crystallography and Photonics" of the RAS (Sections “Introduction” and “Conclusion”).

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